Computed Tomography for Technologists: Exam Review (Point (Lippincott Williams & Wilkins))
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- Seller:RepTextbooks
- Sales Rank:163,387
- Languages:English (Unknown), English (Original Language), English (Published)
- Media:Paperback
- Number Of Items:1
- Edition:1 Pap/Psc
- Pages:200
- Shipping Weight (lbs):1
- Dimensions (in):10.7 x 8.3 x 0.6
- Publication Date:February 17, 2010
- ISBN:0781777968
- EAN:9780781777964
- ASIN:0781777968
Availability:Usually ships in 1-2 business days
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Synopsis
Leveraging the organization and focus on exam preparation found in the comprehensive text, this Exam Review will help any student to successfully complete the ARRT General Radiography and Computed Tomography exams. The book includes a bulleted format review of content, Registry-style questions with answers and rationales, and a mock exam following the ARRT format. The companion website offers an online testing simulation engine.
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